[PATCH] Work around test failure on big-endian architectures

[PATCH] Work around test failure on big-endian architectures

Because the endianness of the target system results in data being
layed out differently in memory, the manually constructed test input
doesn't result in the expected failure modes, which is interpreted as
a test failure.

This is not a permanent fix.  See
https://dovecot.org/mailman3/archives/list/dovecot@dovecot.org/message/FZBVU55TK5332SMZSSDNWIVJCWGUAJQS/

Gbp-Pq: Name work-around-test-failure-on-big-endian-architectures.patch